<?xml version="1.0" encoding="UTF-8"?>
<resource xsi:schemaLocation="http://datacite.org/schema/kernel-4 http://schema.datacite.org/meta/kernel-4/metadata.xsd"
          xmlns="http://datacite.org/schema/kernel-4"
          xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
    <identifier identifierType="DOI">10.48788/DVUA/IVKESW</identifier>
    <creators><creator><creatorName>O.Y. Khyzhun</creatorName><nameIdentifier schemeURI="https://orcid.org/" nameIdentifierScheme="ORCID">0000-0002-2403-8607</nameIdentifier><affiliation>(Frantsevych Institute for Problems of Materials Science of NAS of Ukraine)</affiliation></creator><creator><creatorName>N. M. Denysyuk</creatorName><nameIdentifier schemeURI="https://orcid.org/" nameIdentifierScheme="ORCID">0000-0002-0492-1945</nameIdentifier><affiliation>(Frantsevych Institute for Problems of Materials Science of NAS of Ukraine)</affiliation></creator></creators>
    <titles>
        <title>XPS experiment dataset for crystal Tl3PbBr5</title>
    </titles>
    <publisher>DataverseUA</publisher>
    <publicationYear>2023</publicationYear>
    <resourceType resourceTypeGeneral="Dataset"/>
    <relatedIdentifiers><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/ITNN5E</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/WVBJ6U</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/RWDDK5</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/LKVKHZ</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/7MTAAP</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/UOZEUJ</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/MYYXVF</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/AE6UJA</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/TEVCJX</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/QAIHPY</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/VYGV9L</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/8G4ORR</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/5Z68D0</relatedIdentifier><relatedIdentifier relatedIdentifierType="DOI" relationType="HasPart">doi:10.48788/DVUA/IVKESW/P2MHSC</relatedIdentifier></relatedIdentifiers>
    <descriptions>
        <description descriptionType="Abstract">The X-ray photoelectron core-level and valence-band spectra for pristine and Ar+-ion irradiated surfaces of a Tl3PbBr5 single crystal grown by the Bridgman–Stockbarger method have been measured. The present X-ray photoelectron spectroscopy (XPS) results reveal high chemical stability of Tl3PbBr5 single crystal surface.</description>
    </descriptions>
    <contributors><contributor contributorType="ContactPerson"><contributorName>O.Y. Khyzhun</contributorName><affiliation>(Frantsevych Institute for Problems of Materials Science of NAS of Ukraine)</affiliation></contributor></contributors>
</resource>
