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The dataset encompasses wide-range survey energy scans, high-resolution core-level regions (Cs 3d, Hg 4f, and I 3d), as well as low-binding-energy valence-band spectra. Measurements were conducted both on the pristine surface (cleaved in ultra-high vacuum) and following surface bombardment with low-energy Ar+ ions. 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(2015). Electronic structure and optical properties of Cs2HgI4: Experimental study and band-structure DFT calculations. Optical Materials, 42, 351–360. https://doi.org/10.1016/j.optmat.2015.01.026"},"publicationIDType":{"typeName":"publicationIDType","multiple":false,"typeClass":"controlledVocabulary","value":"doi"},"publicationIDNumber":{"typeName":"publicationIDNumber","multiple":false,"typeClass":"primitive","value":"10.1016/j.optmat.2015.01.026"},"publicationURL":{"typeName":"publicationURL","multiple":false,"typeClass":"primitive","value":"https://doi.org/10.1016/j.optmat.2015.01.026"}}]},{"typeName":"notesText","multiple":false,"typeClass":"primitive","value":"Material: Cs2HgI4 single crystal; Crystal-growth method: vertical Bridgman–Stockbarger technique; Surface condition: pristine (cleaved in UHV) and Ar+-ion irradiated; Deposited spectral regions: survey, Cs 3d, Hg 4f, I 3d, and valence band.\n System: SPECS UHV-Analysis-System (Germany); Electron energy analyzer: PHOIBOS 150 hemispherical analyzer; Excitation source: Mg K-alpha radiation (photon energy: 1253.6 eV); X-ray source power: 100 W (anode voltage: 10 kV, emission current: 10 mA); Analyzer pass energy: 30 eV; Analysis chamber pressure: approximately 4 × 10^-10 mbar; Binding-energy range: 1000 to -10 eV; Energy step: 0.1 eV; Dwell time: 0.1 s; Analyzer take-off angle: 90° relative to the sample surface (normal emission).\n The spectrometer energy scale was calibrated using the Au 4f7/2 and Cu 2p3/2 lines of pure gold and copper reference samples at binding energies of 84.00 ± 0.05 eV and 932.66 ± 0.05 eV, respectively. Charging-related energy shifts were corrected using the C 1s line of adventitious hydrocarbon contamination set at 284.8 eV. Samples were mounted on a molybdenum sample holder."},{"typeName":"language","multiple":true,"typeClass":"controlledVocabulary","value":["English"]},{"typeName":"producer","multiple":true,"typeClass":"compound","value":[{"producerName":{"typeName":"producerName","multiple":false,"typeClass":"primitive","value":"Frantsevych Institute for Problems of Materials Science of NAS of Ukraine"},"producerAffiliation":{"typeName":"producerAffiliation","multiple":false,"typeClass":"primitive","value":"National Academy of Sciences of Ukraine"},"producerAbbreviation":{"typeName":"producerAbbreviation","multiple":false,"typeClass":"primitive","value":"IPM NASU / ІПМ НАНУ"},"producerURL":{"typeName":"producerURL","multiple":false,"typeClass":"primitive","value":"https://www.ipms.kyiv.ua/?utm_source=chatgpt.com"}}]},{"typeName":"productionDate","multiple":false,"typeClass":"primitive","value":"2014-11-20"},{"typeName":"productionPlace","multiple":true,"typeClass":"primitive","value":["Kyiv, 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