TEM and SAED study of island-like CoFe thin filmshttps://doi.org/10.48788/DVUA/B2WHCUPazukha, IrynaShkurdoda, YuriiPylypenko, OleksandrDataverseUA2026-06-302026-06-30T12:55:13ZThe impact of component concentration on the crystal structure and microstructure of island-like CoFe thin films was studied by the Selected Area Electron Diffraction (SAED) technique and Transmission Electron Microscopy (TEM)Physicscrystal structuretransmission electron microscopyisland-like thin film2026-06-30Pazukha, Iryna2026-06-30TEM imagesSAEDCC0 1.0