Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)https://doi.org/10.48788/DVUA/FJ9M9GPazukha, IrynaShkurdoda, YuriiPylypenko, OleksandrVorobiov, SerhiiDataverseUA2026-05-122026-05-12T11:57:20ZThe atomic force microscopy was used to analyze the effect of the insulator matrix on the morphology of iron-insulator discontinuous multilayers [Fe/I]n/S (I = SiO2, HfO2, and MgO)PhysicsAtomic force microscopydiscontinuous multilayers2026-05-12Pazukha, Iryna2026-05-12AFM imagesCC0 1.0