TEM and SAED study of island-like CoFe thin filmsdoi:10.48788/DVUA/B2WHCUDataverseUA2026-06-301Pazukha, Iryna; Shkurdoda, Yurii; Pylypenko, Oleksandr, 2026, "TEM and SAED study of island-like CoFe thin films", https://doi.org/10.48788/DVUA/B2WHCU, DataverseUA, V1TEM and SAED study of island-like CoFe thin filmsdoi:10.48788/DVUA/B2WHCUPazukha, IrynaShkurdoda, YuriiPylypenko, Oleksandr-0126U000589DataverseUAPazukha, IrynaPazukha, Iryna2026-06-30Physicscrystal structuretransmission electron microscopyisland-like thin filmThe impact of component concentration on the crystal structure and microstructure of island-like CoFe thin films was studied by the Selected Area Electron Diffraction (SAED) technique and Transmission Electron Microscopy (TEM)TEM imagesSAEDA Transmission Electron Microscope (TEM) JEOL 2100F UHR operated at 200kV with a Field Emission Gun (FEG) was used to study the microstructure of island-like CoxFe1-x thin films. Image characterization was performed in scanning/transmission modes using a bright-field detector. Phase identification was confirmed using Selected Area Electron Diffraction (SAED). The island-like CoxFe1-x thin films with x = 0.3, 0.5, 0.7 were prepared by sequential magnetron sputtering on the copper mush with a carbon layer.ABSF Filtered 013_Co30Fe70.jpgimage/jpegABSF Filtered 03_Co50Fe50.jpgimage/jpegABSF Filtered growth 03_Co70Fe30.jpgimage/jpegdiff_Co30Fe70.jpgimage/jpegdiff_Co50Fe50.jpgimage/jpegdiff_Co70Fe30.jpgimage/jpegTEM_Co30Fe70.jpgimage/jpegTEM_Co50Fe50.jpgimage/jpegTEM_Co70Fe30.jpgimage/jpeg