Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopydoi:10.48788/DVUA/U6JWSRDataverseUA2026-08-241Tkach, Vira; O.Y. Khyzhun; N.M. Denysіuk; Kopylova Kateryna Ihorivna, 2026, "Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopy", https://doi.org/10.48788/DVUA/U6JWSR, DataverseUA, V1Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopySurvey, Core-Level, and Valence-Band XPS Spectra of the Pristine SurfaceАналіз сполуки Ag2HgSnS4 методом рентгенівської фотоелектронної спектроскопіїdoi:10.48788/DVUA/U6JWSRTkach, ViraO.Y. KhyzhunN.M. DenysіukKopylova Kateryna IhorivnaUHV ANALYSIS SYSTEM Centre, Department No. 47 of Surface Spectroscopy of Novel Materials, Frantsevich Institute for Problems of Materials Science of NAS of UkraineFrantsevych Institute for Problems of Materials Science of NAS of Ukraine2014-03-15Kyiv, UkraineOriginLabDataverseUADataverseUATkach, ViraTkach, Vira2026-02-26ChemistryEngineeringPhysicsSemiconductorsX-ray photoelectron spectroscopyElectronic structureAg2HgSnS4Quaternary chalcogenideCore-level spectraValence-band spectrumSurface compositionCondensed matter physicsSurface scienceSemiconductorThis dataset contains survey, high-resolution core-level, and valence-band X-ray photoelectron spectroscopy (XPS) data obtained from the pristine surface of an Ag2HgSnS4 single crystal grown by the Bridgman–Stockbarger technique. The deposited files cover the Ag 3d, Hg 4f, Sn 3d, and S 2p core levels together with the valence-band region and include both numerical spectral data and corresponding graphical representations. The data can be used to examine the elemental composition, core-level electronic states, and valence electronic structure of the untreated Ag2HgSnS4 single-crystal surface. All deposited spectra correspond to the pristine surface.2014-03-152014-01-012014-03-15XPS experiment datasetSample information: Material: Ag2HgSnS4 single crystal Crystal-growth method: Bridgman–Stockbarger technique Surface condition: pristine Deposited spectral regions: survey, Ag 3d, Hg 4f, Sn 3d, S 2p, and valence band XPS measurement parameters: System: SPECS UHV-Analysis-System, Germany Electron energy analyzer: PHOIBOS 150 hemispherical analyzer Excitation source: Mg K-alpha radiation Photon energy: 1253.6 eV Anode voltage: 10 kV Emission current: 10 mA X-ray source power: 100 W Analyzer pass energy: 30 eV Analysis chamber pressure: approximately 4 × 10^-10 mbar Binding-energy range: 1000 to -10 eV Energy step: 0.1 eV Dwell time: 0.1 s Source angle: 45° Source-to-sample-plane angle: 55° Analyzer take-off angle: 90° relative to the sample surface (normal emission) The spectrometer energy scale was calibrated using the Au 4f7/2 and Cu 2p3/2 lines of pure gold and copper reference samples at binding energies of 84.00 ± 0.05 eV and 932.66 ± 0.05 eV, respectively. Charging-related energy shifts were corrected using the C 1s line of adventitious hydrocarbon contamination. Samples were mounted on a molybdenum sample holder.Original survey, core-level, and valence-band XPS spectra measured for the pristine surface of an Ag2HgSnS4 single crystal using a SPECS UHV-Analysis-System equipped with a PHOIBOS 150 hemispherical electron energy analyzer.Зв'яжіться з авторомBozhko, V.V., Tretyak, A.P., Parasyuk, O.V., Ocheretova, V.A., and Khyzhun, O.Y. (2014). Electronic structure of non-centrosymmetric Ag2HgSnS4 single crystal. Optical Materials, 36(5), 977–981. https://doi.org/10.1016/j.optmat.2014.01.00510.1016/j.optmat.2014.01.005Bozhko, V.V., Tretyak, A.P., Parasyuk, O.V., Ocheretova, V.A., and Khyzhun, O.Y. (2014). Electronic structure of non-centrosymmetric Ag2HgSnS4 single crystal. Optical Materials, 36(5), 977–981. https://doi.org/10.1016/j.optmat.2014.01.005CITATION.cffMachine-readable citation metadata for the dataset in Citation File Format 1.2.0.application/octet-streamdata_dictionary.mdData dictionary for the numerical Ag2HgSnS4 XPS spectra. The file defines the column names, physical quantities, units, tab delimiter, decimal-comma notation, data types, spectral regions, surface condition, and recommendations for importing and interpreting the deposited plain-text files.text/markdownLICENSE.txtCreative Commons Attribution 4.0 International license notice and recommended attribution.text/plainmanifest.jsonMachine-readable inventory of all files in the deposited data package and the relationships between numerical spectra and derived images.application/jsonReadMe.txtDataset-level documentation, methodological information, file inventory, and reuse guidance.text/plainxps.jsonMachine-readable metadata describing the sample, XPS instrument, excitation source, acquisition parameters, measurement geometry, calibration, processing, spectral regions, related publication, and license.application/jsonAg2HgSnS4_Ag_3d.jpgspectrum of Ag 3d levelimage/jpegAg2HgSnS4_Hg_4f.jpgspectrum of Hg 4f levelimage/jpegAg2HgSnS4_Sn_3d.jpgspectrum of Sn 3d levelimage/jpegAg2HgSnS4_surv.jpgsurvey XPS-graphimage/jpegAg2HgSnS4_S_2p.jpgspectre of S 2p levelimage/jpegAg2HgSnS4_VB.jpgValence-band XPS spectrum for the pristine surfaceimage/jpegAg2HgSnS4_Ag_3d.txtspectral data for Ag 3d electrons (raw surface) text/plainAg2HgSnS4_Hg_4f.txtspectral data for Hg 4f electrons (raw surface) text/plainAg2HgSnS4_Sn_3d.txtspectral data for Sn 3d electrons (raw surface) text/plainAg2HgSnS4_surv.txtsurvey XPS-data for pristine surfacetext/plainAg2HgSnS4_S_2p.txtspectral data for S 2p electrons (raw surface) text/plainAg2HgSnS4_VB.txtvalence band spectrum (raw surface)text/plain