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Part 1: Document Description
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Citation |
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Title: |
Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopy |
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Identification Number: |
doi:10.48788/DVUA/U6JWSR |
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Distributor: |
DataverseUA |
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Date of Distribution: |
2026-08-24 |
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Version: |
1 |
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Bibliographic Citation: |
Tkach, Vira; O.Y. Khyzhun; N.M. Denysіuk; Kopylova Kateryna Ihorivna, 2026, "Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopy", https://doi.org/10.48788/DVUA/U6JWSR, DataverseUA, V1 |
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Citation |
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Title: |
Analysis of Ag2HgSnS4 Compound by X-ray photoelectron spectroscopy |
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Subtitle: |
Survey, Core-Level, and Valence-Band XPS Spectra of the Pristine Surface |
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Alternative Title: |
Аналіз сполуки Ag2HgSnS4 методом рентгенівської фотоелектронної спектроскопії |
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Identification Number: |
doi:10.48788/DVUA/U6JWSR |
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Authoring Entity: |
Tkach, Vira (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) |
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O.Y. Khyzhun (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) |
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N.M. Denysіuk (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) |
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Kopylova Kateryna Ihorivna (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) |
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Other identifications and acknowledgements: |
UHV ANALYSIS SYSTEM Centre, Department No. 47 of Surface Spectroscopy of Novel Materials, Frantsevich Institute for Problems of Materials Science of NAS of Ukraine |
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Producer: |
Frantsevych Institute for Problems of Materials Science of NAS of Ukraine |
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Date of Production: |
2014-03-15 |
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Software used in Production: |
OriginLab |
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Distributor: |
DataverseUA |
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Distributor: |
DataverseUA |
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Access Authority: |
Tkach, Vira |
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Depositor: |
Tkach, Vira |
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Date of Deposit: |
2026-02-26 |
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Holdings Information: |
https://doi.org/10.48788/DVUA/U6JWSR |
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Study Scope |
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Keywords: |
Chemistry, Engineering, Physics, Semiconductors, X-ray photoelectron spectroscopy, Electronic structure, Ag2HgSnS4, Quaternary chalcogenide, Core-level spectra, Valence-band spectrum, Surface composition |
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Topic Classification: |
Condensed matter physics, Surface science, Semiconductor |
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Abstract: |
This dataset contains survey, high-resolution core-level, and valence-band X-ray photoelectron spectroscopy (XPS) data obtained from the pristine surface of an Ag2HgSnS4 single crystal grown by the Bridgman–Stockbarger technique. The deposited files cover the Ag 3d, Hg 4f, Sn 3d, and S 2p core levels together with the valence-band region and include both numerical spectral data and corresponding graphical representations. The data can be used to examine the elemental composition, core-level electronic states, and valence electronic structure of the untreated Ag2HgSnS4 single-crystal surface. All deposited spectra correspond to the pristine surface. |
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Time Period: |
2014-03-15- |
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Date of Collection: |
2014-01-01-2014-03-15 |
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Kind of Data: |
XPS experiment dataset |
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Notes: |
Sample information: Material: Ag2HgSnS4 single crystal Crystal-growth method: Bridgman–Stockbarger technique Surface condition: pristine Deposited spectral regions: survey, Ag 3d, Hg 4f, Sn 3d, S 2p, and valence band XPS measurement parameters: System: SPECS UHV-Analysis-System, Germany Electron energy analyzer: PHOIBOS 150 hemispherical analyzer Excitation source: Mg K-alpha radiation Photon energy: 1253.6 eV Anode voltage: 10 kV Emission current: 10 mA X-ray source power: 100 W Analyzer pass energy: 30 eV Analysis chamber pressure: approximately 4 × 10^-10 mbar Binding-energy range: 1000 to -10 eV Energy step: 0.1 eV Dwell time: 0.1 s Source angle: 45° Source-to-sample-plane angle: 55° Analyzer take-off angle: 90° relative to the sample surface (normal emission) The spectrometer energy scale was calibrated using the Au 4f7/2 and Cu 2p3/2 lines of pure gold and copper reference samples at binding energies of 84.00 ± 0.05 eV and 932.66 ± 0.05 eV, respectively. Charging-related energy shifts were corrected using the C 1s line of adventitious hydrocarbon contamination. Samples were mounted on a molybdenum sample holder. |
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Methodology and Processing |
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Sources Statement |
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Data Sources: |
Original survey, core-level, and valence-band XPS spectra measured for the pristine surface of an Ag2HgSnS4 single crystal using a SPECS UHV-Analysis-System equipped with a PHOIBOS 150 hemispherical electron energy analyzer. |
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Data Access |
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Notes: |
Зв'яжіться з автором |
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Other Study Description Materials |
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Related Publications |
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Citation |
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Title: |
Bozhko, V.V., Tretyak, A.P., Parasyuk, O.V., Ocheretova, V.A., and Khyzhun, O.Y. (2014). Electronic structure of non-centrosymmetric Ag2HgSnS4 single crystal. Optical Materials, 36(5), 977–981. https://doi.org/10.1016/j.optmat.2014.01.005 |
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Identification Number: |
10.1016/j.optmat.2014.01.005 |
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Bibliographic Citation: |
Bozhko, V.V., Tretyak, A.P., Parasyuk, O.V., Ocheretova, V.A., and Khyzhun, O.Y. (2014). Electronic structure of non-centrosymmetric Ag2HgSnS4 single crystal. Optical Materials, 36(5), 977–981. https://doi.org/10.1016/j.optmat.2014.01.005 |
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Label: |
CITATION.cff |
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Text: |
Machine-readable citation metadata for the dataset in Citation File Format 1.2.0. |
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Notes: |
application/octet-stream |
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Label: |
data_dictionary.md |
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Text: |
Data dictionary for the numerical Ag2HgSnS4 XPS spectra. The file defines the column names, physical quantities, units, tab delimiter, decimal-comma notation, data types, spectral regions, surface condition, and recommendations for importing and interpreting the deposited plain-text files. |
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Notes: |
text/markdown |
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Label: |
LICENSE.txt |
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Text: |
Creative Commons Attribution 4.0 International license notice and recommended attribution. |
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Notes: |
text/plain |
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Label: |
manifest.json |
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Text: |
Machine-readable inventory of all files in the deposited data package and the relationships between numerical spectra and derived images. |
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Notes: |
application/json |
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Label: |
ReadMe.txt |
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Text: |
Dataset-level documentation, methodological information, file inventory, and reuse guidance. |
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Notes: |
text/plain |
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Label: |
xps.json |
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Text: |
Machine-readable metadata describing the sample, XPS instrument, excitation source, acquisition parameters, measurement geometry, calibration, processing, spectral regions, related publication, and license. |
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Notes: |
application/json |
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Label: |
Ag2HgSnS4_Ag_3d.jpg |
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Text: |
spectrum of Ag 3d level |
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Notes: |
image/jpeg |
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Label: |
Ag2HgSnS4_Hg_4f.jpg |
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Text: |
spectrum of Hg 4f level |
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Notes: |
image/jpeg |
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Label: |
Ag2HgSnS4_Sn_3d.jpg |
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Text: |
spectrum of Sn 3d level |
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Notes: |
image/jpeg |
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Label: |
Ag2HgSnS4_surv.jpg |
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Text: |
survey XPS-graph |
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Notes: |
image/jpeg |
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Label: |
Ag2HgSnS4_S_2p.jpg |
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Text: |
spectre of S 2p level |
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Notes: |
image/jpeg |
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Label: |
Ag2HgSnS4_VB.jpg |
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Text: |
Valence-band XPS spectrum for the pristine surface |
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Notes: |
image/jpeg |
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Label: |
Ag2HgSnS4_Ag_3d.txt |
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Text: |
spectral data for Ag 3d electrons (raw surface) |
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Notes: |
text/plain |
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Label: |
Ag2HgSnS4_Hg_4f.txt |
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Text: |
spectral data for Hg 4f electrons (raw surface) |
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Notes: |
text/plain |
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Label: |
Ag2HgSnS4_Sn_3d.txt |
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Text: |
spectral data for Sn 3d electrons (raw surface) |
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Notes: |
text/plain |
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Label: |
Ag2HgSnS4_surv.txt |
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Text: |
survey XPS-data for pristine surface |
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Notes: |
text/plain |
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Label: |
Ag2HgSnS4_S_2p.txt |
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Text: |
spectral data for S 2p electrons (raw surface) |
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Notes: |
text/plain |
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Label: |
Ag2HgSnS4_VB.txt |
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Text: |
valence band spectrum (raw surface) |
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Notes: |
text/plain |