10.48788/DVUA/B2WHCUPazukha, IrynaIrynaPazukha0000-0001-9410-3024Sumy State UniversityShkurdoda, YuriiYuriiShkurdoda0000-0002-8180-4574Sumy State UniversutyPylypenko, OleksandrOleksandrPylypenko0000-0003-0289-1292Sumy State UniversityDataverseUA2026Physicscrystal structuretransmission electron microscopyisland-like thin filmPazukha, IrynaIrynaPazukhaSumy State University2026-06-302026-06-30TEM images468293942541364445585840983734321062439153893588492679image/jpegimage/jpegimage/jpegimage/jpegimage/jpegimage/jpegimage/jpegimage/jpegimage/jpeg1.0CC0 1.0The impact of component concentration on the crystal structure and microstructure of island-like CoFe thin films was studied by the Selected Area Electron Diffraction (SAED) technique and Transmission Electron Microscopy (TEM)A Transmission Electron Microscope (TEM) JEOL 2100F UHR operated at 200kV with a Field Emission Gun (FEG) was used to study the microstructure of island-like CoxFe1-x thin films. Image characterization was performed in scanning/transmission modes using a bright-field detector. Phase identification was confirmed using Selected Area Electron Diffraction (SAED). The island-like CoxFe1-x thin films with x = 0.3, 0.5, 0.7 were prepared by sequential magnetron sputtering on the copper mush with a carbon layer.The State Programs of the Ministry of Education and Science of Ukraine0126U000589