10.48788/DVUA/FJ9M9GPazukha, IrynaIrynaPazukha0000-0001-9410-3024Sumy State UniversityShkurdoda, YuriiYuriiShkurdoda0000-0002-8180-4574Sumy State UniversutyPylypenko, OleksandrOleksandrPylypenko0000-0003-0289-1292Sumy State UniversityVorobiov, SerhiiSerhiiVorobiov0000-0002-5884-3292P.J. Šafárik University in KošiceDataverseUA2026PhysicsAtomic force microscopydiscontinuous multilayersPazukha, IrynaIrynaPazukhaSumy State University2026-05-122026-05-12AFM images101325146783160439131964119329101810image/jpegimage/jpegimage/jpegimage/jpegimage/jpegimage/jpeg1.0CC0 1.0The atomic force microscopy was used to analyze the effect of the insulator matrix on the morphology of iron-insulator discontinuous multilayers [Fe/I]n/S (I = SiO2, HfO2, and MgO)The atomic force microscopy (Bruker, Dimension Icon AFM) was used for the examination of the surface morphology and roughness of the discontinuous multilayer systems [Fe(dFe)/I(3)]n/S, where I = SiO2, HfO2, and MgO, n = 10 is the number of bilayer repeaters. The discontinuous multilayers were prepared by sequential magnetron sputtering at room temperature on a sapphire substrate. The base pressure in the vacuum chamber was 7.10-8 Torr. During sputtering, the chamber was filled with Ar at a constant pressure of 3 mTorr. Radiofrequency (RF) magnetron sputtering at 100 W and a deposition rate of 1 nm/min for the insulator has been used. DC magnetron sputtering at 100 W and a deposition rate of 5 nm/min for the ferromagnet has been used.Ministry of Education and Science of Ukraine0224U033036NATO Program "Science for Peace and Security"G6131