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Persistent Identifier
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doi:10.48788/DVUA/DGS7UW |
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Publication Date
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2026-08-19 |
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Title
| Surface chemscal states of Cu2HgGeSe4 studied by X-ray photoelectron spectroscopy |
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Subtitle
| An XPS and DFT Study |
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Author
| Tkach, Vira (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) - ORCID: 0000-0002-2403-8607
O.Y. Khyzhun (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) - ORCID: 0000-0001-6727-643X
N.M. Denysyuk (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) - ORCID: 0000-0002-0492-1945
Luzhnyi Ivan Vasyliovych (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) - ORCID: 0000-0001-6727-643X
Kopylova Kateryna Ihorivna (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) - ORCID: 0000-0001-6796-390X |
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Point of Contact
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Use email button above to contact.
Tkach Vira Andriyvna (Frantsevich Institute for Problems of Materials Science of NAS of Ukraine) |
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Description
| The electronic structure and surface chemical states of a Cu2HgGeSe4 single crystal, grown by the Bridgman–Stockbarger method, were investigated using X-ray photoelectron spectroscopy (XPS) for pristine and Ar+ ion-irradiated surfaces. High-resolution core-level XPS spectra (Cu 2p, Hg 4f, Ge 3d, Se 3d, Se 3p) and valence-band spectra were recorded before and after Ar+ ion sputtering to evaluate the core-level binding energies, chemical state preservation, and structural stability of the Cu2HgGeSe4 surface under ion-beam treatment. (2020-08-01) |
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Subject
| Chemistry; Engineering; Physics |
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Keyword
| Semiconductors https://www.dictionary.com/browse/semiconductor
X-ray photoelectronic spectra (AIP Physics and Astronomy Classification Scheme (PACS)) https://meshb.nlm.nih.gov/record/ui?ui=D018625
Electronic structure https://surl.li/iwyvei |
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Topic Classification
| Semiconductors (ASJC (All Science Journal Classification))
Condensed Matter Physics (LCSH (Library of Congress Subject Headings))
Surface Science (LCSH (Library of Congress Subject Headings)) |
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Related Publication
| B.V. Gabrelian, A.A. Lavrentyev, Tuan V. Vu, V.A. Tkach, O.V. Marchuk, K.F. Kalmykova, L.N. Ananchenko, O.V. Parasyuk, O.Y. Khyzhun, Quaternary Cu2HgGeSe4 selenide: Its electronic and optical properties as elucidated from TB-mBJ band-structure calculations and XPS and XES measurements, Chemical Physics, Volume 536, 2020, 110821, ISSN 0301-0104, https://doi.org/10.1016/j.chemphys.2020.110821. (https://www.sciencedirect.com/science/article/pii/S0301010420300021) doi: 10.1016/j.chemphys.2020.110821 https://doi.org/10.1016/j.chemphys.2020.110821 |
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Notes
| **In-situ Surface Preparation & Ion Etching Regimes:** * Preparation Mode: In-situ ion-beam cleaning with Ar+ ions (Ex-situ: No) * Ion Gun Voltage (V): 3 kV * Etching Current (I): 17 uA * Etching Time (t): 5 min * Etching Pressure (P): 8x10^-6 mbar * Etching Angle (theta): 55 deg **XPS Measurement & Spectrometer Parameters:** * System/Analyzer: UHV-Analysis-System SPECS (Germany), Hemispherical Analyzer PHOIBOS 150 * Excitation Source: Mg K-alpha radiation * Characteristic Energy: 1253.6 eV * Anode Voltage: 10 kV * Emission Current: 100 mA * Source Power: 100 W * Analysis Chamber Pressure: 4x10^-10 mbar * Pass Energy: 30 eV * Energy Range (Binding Energy): 1000 eV to -10 eV * Step Size: 0.1 eV/step * Dwell Time: 0.1 s * Geometry: Source Angle: 45 deg; Source-to-sample plane angle: 55 deg; Analyzer axis take-off polar angle: 90 deg (normal emission relative to sample surface) |
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Language
| English |
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Producer
| Frantsevych Institute for Problems of Materials Science of NAS of Ukraine (N.A.S. of Ukraine) (IPM NASU / ІПМ НАНУ) https://www.ipms.kyiv.ua/?utm_source=chatgpt.com |
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Production Date
| 2019-09-01 |
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Production Location
| Kyiv, Ukraine |
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Contributor
| Research Group : Department 47 of Surface Spectroscopy of Novel Materials, Frantsevich Institute for Problems of Materials Science |
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Funding Information
| NAS of Ukraine |
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Depositor
| Tkach, Vira |
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Deposit Date
| 2026-04-08 |
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Time Period
| Start Date: 2019-08-01 |
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Date of Collection
| Start Date: 2019-08-01 ; End Date: 2020-05-01 |
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Data Type
| XPS experiment dataset |