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Tabular Data - 3.3 KB - 13 Variables, 19 Observations - UNF:6:Rz7v2xYYXZDqjz8snUNdpw==
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May 12, 2026 - Sumy State University
Pazukha, Iryna; Shkurdoda, Yurii; Pylypenko, Oleksandr; Vorobiov, Serhii, 2026, "Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)", https://doi.org/10.48788/DVUA/FJ9M9G, DataverseUA, V1
The atomic force microscopy was used to analyze the effect of the insulator matrix on the morphology of iron-insulator discontinuous multilayers [Fe/I]n/S (I = SiO2, HfO2, and MgO) |
May 12, 2026 -
Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 99.0 KB -
MD5: ef0eb460a4091ba6b7fa432689caf6ad
The AFM image of the discontinuous multilayer systems [Fe(2)/HfO2(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature. |
May 12, 2026 -
Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 143.3 KB -
MD5: 13e746067f2611d3021e746bbc4f172f
The AFM image of the discontinuous multilayer systems [Fe(2)/SiO2(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature. |