Center for collective use of appliances "High-vacuum analytical system UHV-ANALYSIS-SYSTEM" is designed to conduct research in the field of electronic structure, elemental and phase composition of the surface of solids without their destruction. This center was created on the basis of Frantsevych Institute for Problems of Materials Science of the National Academy of Sciences of Ukraine for the rational use of modern equipment by scientific institutions and organizations of the National Academy of Sciences of Ukraine. The main task of the Center " High-vacuum analytical system UHV-ANALYSIS-SYSTEM" is to provide scientists of the NAS of Ukraine the opportunity to conduct research on modern devices, which are serviced by qualified personnel capable of maintaining equipment in high quality working conditions and provide consulting services. Techniques used in the center: 1) X-ray photoelectron spectroscopy; 2) ultraviolet spectroscopy, Auger spectroscopy; 3) diffraction of slow electrons. Elements analyzed: all except hydrogen.
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spectral data for the Br 3p core-level XPS spectrum acquired after Ar+ ion irradiation
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Graphical representation derived from the pristine-surface C 1s XPS spectrum.
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spectral data for C 1s electrons (pristine surface)
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spectral data for the C 1s XPS spectrum acquired after Ar+ ion irradiation
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spectral data for the combined Pb 4d and Tl 4d core-level XPS region acquired from the pristine surface
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spectral data for the combined Pb 4d and Tl 4d core-level XPS region acquired after Ar+ ion irradiation
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Graphical representation of the Tl 4f core-level and Pb 4f core-level XPS spectrum
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spectral data fordata for the Tl 4f core-level XPS spectrum acquired from the pristine surface
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spectral data for the combined Pb 4f and Tl 4f core-level XPS region acquired after Ar+ ion irradiation
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Graphical representation of the valence-band XPS spectrum.
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