Center for collective use of appliances "High-vacuum analytical system UHV-ANALYSIS-SYSTEM" is designed to conduct research in the field of electronic structure, elemental and phase composition of the surface of solids without their destruction. This center was created on the basis of Frantsevych Institute for Problems of Materials Science of the National Academy of Sciences of Ukraine for the rational use of modern equipment by scientific institutions and organizations of the National Academy of Sciences of Ukraine. The main task of the Center " High-vacuum analytical system UHV-ANALYSIS-SYSTEM" is to provide scientists of the NAS of Ukraine the opportunity to conduct research on modern devices, which are serviced by qualified personnel capable of maintaining equipment in high quality working conditions and provide consulting services. Techniques used in the center: 1) X-ray photoelectron spectroscopy; 2) ultraviolet spectroscopy, Auger spectroscopy; 3) diffraction of slow electrons. Elements analyzed: all except hydrogen.
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Plain Text - 4.7 KB - MD5: 9fe59522434a9c38512e06fadfce09ad
spectral data for the valence-band XPS spectrum acquired from the pristine surface
Plain Text - 4.6 KB - MD5: 7efa8b69da5c31e3fa618cf96017471b
spectral data for the valence-band XPS spectrum acquired after Ar+ ion irradiation.
JPEG Image - 996.0 KB - MD5: dd14cdb1536a1e285f34ee60abfc0b48
Graphical representation of the XPS survey spectrum.
Plain Text - 12.8 KB - MD5: 9b438afdc4821e1be753107a3d1a1df7
spectral data for XPS survey spectrum acquired from the pristine surface
Markdown Text - 5.3 KB - MD5: b31b925c55aff3d8cfbaa788a25dae2b
definitions of the columns, physical quantities, units, tab delimiter, decimal-comma notation, data types, and import requirements for the numerical spectral files
JSON - 3.6 KB - MD5: 1244396fb4c6377a3a4acf124eba78d2
Machine-readable inventory of all files in the deposited data package and the relationships between numerical spectra and derived images.
JSON - 5.0 KB - MD5: 79fed88fa7953349e1907400420cdd15
machine-readable metadata describing the sample, XPS instrument, excitation source, acquisition parameters, measurement geometry, calibration, processing, spectral regions, related publication, and license.
Aug 24, 2026
Tkach, Vira; O.Y. Khyzhun; N.M. Denysіuk; Luzhnyi Ivan Vasyliovych, 2026, "Electronic structure and optical properties of Cs2HgI4: Experimental study and band-structure DFT calculations", https://doi.org/10.48788/DVUA/JSPAOF, DataverseUA, V1
Experimental X-ray photoelectron spectroscopy (XPS) dataset collected for a Cs2HgI4 single crystal synthesized via the vertical Bridgman–Stockbarger method. The dataset encompasses wide-range survey energy scans, high-resolution core-level regions (Cs 3d, Hg 4f, and I 3d), as wel...
Unknown - 1.8 KB - MD5: 3eab82232ce1ec37f1f159d5b4530cca
machine-readable citation metadata for the dataset in Citation File Format 1.2.0.
PNG Image - 81.4 KB - MD5: 60663213f42de00ce2bc1f8f6e6cbbc1
XPS spectrum of C 1s core level before and after Ar⁺ sputtering
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