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Notes
| The atomic force microscopy (Bruker, Dimension Icon AFM) was used for the examination of the surface morphology and roughness of the discontinuous multilayer systems [Fe(dFe)/I(3)]n/S, where I = SiO2, HfO2, and MgO, n = 10 is the number of bilayer repeaters. The discontinuous multilayers were prepared by sequential magnetron sputtering at room temperature on a sapphire substrate. The base pressure in the vacuum chamber was 7.10-8 Torr. During sputtering, the chamber was filled with Ar at a constant pressure of 3 mTorr. Radiofrequency (RF) magnetron sputtering at 100 W and a deposition rate of 1 nm/min for the insulator has been used. DC magnetron sputtering at 100 W and a deposition rate of 5 nm/min for the ferromagnet has been used. |