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Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
May 12, 2026 - Sumy State University
Pazukha, Iryna; Shkurdoda, Yurii; Pylypenko, Oleksandr; Vorobiov, Serhii, 2026, "Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)", https://doi.org/10.48788/DVUA/FJ9M9G, DataverseUA, V1
The atomic force microscopy was used to analyze the effect of the insulator matrix on the morphology of iron-insulator discontinuous multilayers [Fe/I]n/S (I = SiO2, HfO2, and MgO)
[Fe(2)HfO2(3)]10_RT.jpg
[Fe(2)HfO2(3)]10_RT.jpg
May 12, 2026 - Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 99.0 KB - MD5: ef0eb460a4091ba6b7fa432689caf6ad
The AFM image of the discontinuous multilayer systems [Fe(2)/HfO2(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature.
[Fe(2)SiO2(3)]10_RT.jpg
[Fe(2)SiO2(3)]10_RT.jpg
May 12, 2026 - Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 143.3 KB - MD5: 13e746067f2611d3021e746bbc4f172f
The AFM image of the discontinuous multilayer systems [Fe(2)/SiO2(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature.
[Fe(7)HfO2(3)]10_RT.jpg
[Fe(7)HfO2(3)]10_RT.jpg
May 12, 2026 - Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 156.7 KB - MD5: b73b93977a88ef1a1cf63214d7d6f70b
The AFM image of the discontinuous multilayer systems [Fe(7)/HfO2(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature.
[Fe(7)MgO(3)}10_RT.jpg
[Fe(7)MgO(3)}10_RT.jpg
May 12, 2026 - Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 128.9 KB - MD5: fac9f45b4cf308610d9604ea577b67a2
The AFM image of the discontinuous multilayer systems [Fe(7)/MgO(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature.
[Fe(7)SiO2(3)]10_RT.jpg
[Fe(7)SiO2(3)]10_RT.jpg
May 12, 2026 - Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 116.5 KB - MD5: cd4f0026e8d2773952c354855defef5b
The AFM image of the discontinuous multilayer systems [Fe(7)/SiO2(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature.
[{Fe(2)MgO(3)]10_RT.jpg
[{Fe(2)MgO(3)]10_RT.jpg
May 12, 2026 - Atomic force microscopy images of [Fe/I]n discontinious multilayers (I = SiO2, MgO, HfO2)
JPEG Image - 99.4 KB - MD5: 7688afadf618cb2574a8bacc23786b60
The AFM image of the discontinuous multilayer systems [Fe(2)/MgO(3)]10/S, which was prepared by sequential magnetron sputtering on the sapphire substrate at room temperature.
Дані про призначення покарань за правопорушення, пов’язані з декларуванням, та незаконним збагаченням (за ст. 366-2, 366-3, 368-5 КК України) у 2020-2025 роках.
Apr 2, 2026 - Sumy State University
Малетова, Ольга, 2026, "Дані про призначення покарань за правопорушення, пов’язані з декларуванням, та незаконним збагаченням (за ст. 366-2, 366-3, 368-5 КК України) у 2020-2025 роках.", https://doi.org/10.48788/DVUA/MAU1WO, DataverseUA, V1, UNF:6:w2G8Y/aMixIZZmbcQHnX5w== [fileUNF]
Цей набір даних містить детальну інформацію про судову практику щодо кримінальних проваджень, відкритих за статтями 366-2, 366-3 та 368-5 Кримінального кодексу України, які стосуються неподання декларації, подання завідомо недостовірних відомостей у декларації особи, уповноважено...
Дані про призначення покарань за правопорушення, пов’язані з декларуванням, та незаконним збагаченням.tab
Apr 2, 2026 - Дані про призначення покарань за правопорушення, пов’язані з декларуванням, та незаконним збагаченням (за ст. 366-2, 366-3, 368-5 КК України) у 2020-2025 роках.
Tabular Data - 25.1 KB - 16 Variables, 51 Observations - UNF:6:w2G8Y/aMixIZZmbcQHnX5w==
Дані про призначення покарань за правопорушення, пов’язані з декларуванням, та незаконним збагаченням (за ст. 366-2, 366-3, 368-5 КК України) у 2020-2025 роках
X-ray photoelectron and Nuclear Magnetic Resonance studies of sol-gel glass doped with 5% Ga
X-ray photoelectron and Nuclear Magnetic Resonance studies of sol-gel glass doped with 5% Ga
Mar 27, 2026 - SPM&RS Centre
Smolyak Svitlana; Karbivskyy Volodymyr; Zagorodniy Yuriy, 2026, "X-ray photoelectron and Nuclear Magnetic Resonance studies of sol-gel glass doped with 5% Ga", https://doi.org/10.48788/DVUA/MNVHJZ, DataverseUA, V1
The electronic structure and structural characteristics of 5% Ga-doped sol-gel bioactive glass (type 45S5) were studied by X-ray photoelectron spectroscopy (XPS) and nuclear magnetic resonance (NMR) methods. ³¹P NMR spectra of bioactive materials indicate the formation of both is...
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